Title :
Digest of Papers IEEE International Workshop on IDDQ Testing [Front Cover and Table of Contents]
Abstract :
Presents front cover and table of contents from the conference proceedings.
Keywords :
integrated circuit testing; IC reliability; analogue integrated circuits; current sensors; limit setting; mixed signal circuits; physical failure mechanisms; submicron ICs; test generation; test strategies;
Conference_Titel :
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-8123-3
DOI :
10.1109/IDDQ.1997.633003
