DocumentCode
1735243
Title
Digest of Papers IEEE International Workshop on IDDQ Testing [Front Cover and Table of Contents]
fYear
1997
Abstract
Presents front cover and table of contents from the conference proceedings.
Keywords
integrated circuit testing; IC reliability; analogue integrated circuits; current sensors; limit setting; mixed signal circuits; physical failure mechanisms; submicron ICs; test generation; test strategies;
fLanguage
English
Publisher
ieee
Conference_Titel
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location
Washington, DC, USA
Print_ISBN
0-8186-8123-3
Type
conf
DOI
10.1109/IDDQ.1997.633003
Filename
633003
Link To Document