Title :
3D microscopy provides the first deep view
Author :
Miao, Jianwei ; Song, Changyong ; Nishino, Yoshinori ; Kohmura, Yoshiki ; Johnson, Bart ; Ishikawa, Takaaki
Author_Institution :
Dept. of Phys. & Astron., California Univ., Los Angeles, CA, USA
Abstract :
Coherent X-ray diffraction microscopy has recently been developed to image nanostructures and biological systems in two and three dimensions. A highest resolution of 7 nm has been achieved. We anticipate this 3D imaging technique will find broad applications in the burgeoning field of nanoscience and technology.
Keywords :
X-ray diffraction; X-ray imaging; X-ray microscopy; nanotechnology; 3D imaging; 3D microscopy; X-ray diffraction microscopy; biological systems; image nanostructure; Atomic measurements; Frequency; Gold; High-resolution imaging; Nanobioscience; Optical imaging; Scanning electron microscopy; Synchrotron radiation; X-ray diffraction; X-ray imaging;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
DOI :
10.1109/SENSOR.2005.1497319
