DocumentCode
1735636
Title
Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard
Author
Wang, Laung-Terng ; Apte, Ravi ; Wu, Shianling ; Sheu, Boryau ; Lee, Kuen-Jong ; Wen, Xiaoqing ; Jone, Wen-Ben ; Yeh, Chia-Hsien ; Wang, Wei-Shin ; Chao, Hao-Jan ; Guo, Jianghao ; Liu, Jinsong ; Niu, Yanlong ; Sung, Yi-Chih ; Wang, Chi-Chun ; Li, Fangfang
Author_Institution
SynTest Technol., Inc., Sunnyvale, CA
fYear
2008
Firstpage
1
Lastpage
9
Abstract
This paper describes a core-based test and diagnosis integration and automation system, called Turbo1500, which automatically synthesizes test and diagnosis logic in accordance with the IEEE 1500 standard. Turbo1500 serves two major purposes. One is for use as a core test automation tool in a system-on-chip (SOC) environment to automatically connect multiple cores from various sources and create testbenches each targeting an individual core under the control of a chip-level test access port (TAP) controller. The other is for hierarchical (block-by-block) core test and diagnosis when chips on a printed-circuit board are embedded with 1149.1 boundary scan I/O cells and cores under test and diagnosis are surrounded with 1500-compliant wrapper cells. Application experience showed that the simplicity of the IEEE 1500 standard combined with an easy-to-use automation tool can make core-based design for test and diagnosis no longer a nightmare, especially when some cores are extremely large or complex.
Keywords
integrated circuit testing; printed circuits; system-on-chip; IEEE 1500 standard; Turbo1500; automation system; chip-level test access port controller; core-based design; core-based test; diagnosis integration; easy-to-use automation tool; multiple cores; printed-circuit board; system-on-chip; Automatic testing; Built-in self-test; Circuit testing; Control systems; Design automation; Electronic equipment testing; Field programmable gate arrays; Integrated circuit testing; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700630
Filename
4700630
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