Title :
WLR discussion group summary
Author :
Graas, Carole ; Achee, E.
Author_Institution :
Infineon Technologies
Abstract :
Discusses wafer level reliability.
Keywords :
Semiconductor materials;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1999. IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-5649-7
DOI :
10.1109/IRWS.1999.830573
