Title :
Wafer-level integration technology of surface mount devices using automatic parts alignment technology with vibration
Author :
Sudou, Minoru ; Takao, Hidekuni ; Sawada, Kazuaki ; Ishida, Makoto
Author_Institution :
Seiko Instruments Inc., Japan
Abstract :
This paper presents a new wafer-level integration technology of discrete surface mount devices (SMDs) on silicon-wafers. It is automatic parts alignment on silicon-wafer by means of gravity force and vibration. After silicon IC process, deep holes were formed by deep reactive ion etching (DRIE) process to arrange SMDs. Then a non-conductivity adhesive was spin coated and removed it on the silicon-wafer surface leaving the adhesive at the bottom of the holes. We fixed the silicon-wafer diagonally to a vibration generator and distribute SMDs on it. By vibrating the silicon-wafer, SMDs go down to the lower side occupying the holes automatically. As a result, two different sizes of SMDs were successfully mounted into every hole on silicon wafer. This technology is promising to integrate various discrete devices on integrated devices with batch process-like productivity.
Keywords :
integrated circuit packaging; micromechanical devices; multichip modules; silicon; sputter etching; surface mount technology; wafer-scale integration; MEMS; automatic parts alignment technology; batch process productivity; deep reactive ion etching; gravity force; multichip module; nonconductivity adhesive; silicon-wafer surface; spin coating; surface mount devices; vibration; wafer-level integration; Assembly; Etching; Fabrication; Gravity; Instruments; Integrated circuit technology; Micromechanical devices; Productivity; Silicon; Surface-mount technology;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
DOI :
10.1109/SENSOR.2005.1497324