Author :
Vollertsen, Rolf-Peter ; Hijab, R.
Author_Institution :
Infineon Technologies Corp.
fDate :
6/21/1905 12:00:00 AM
Keywords :
Earth Observing System; Electronic mail; Logic testing; Manufacturing; Monitoring; Optical control; Packaging; Production; Rivers; Stress;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1999. IEEE International
Print_ISBN :
0-7803-5649-7
DOI :
10.1109/IRWS.1999.830574
