DocumentCode
1735866
Title
Hot-carriers
Author
Bravaix, A.
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
138
Lastpage
139
Keywords
Acceleration; Circuits; Degradation; Hot carriers; Low voltage; Ring oscillators; Stress measurement; Tunneling; Voltage control; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1999. IEEE International
Print_ISBN
0-7803-5649-7
Type
conf
DOI
10.1109/IRWS.1999.830577
Filename
830577
Link To Document