DocumentCode
1735906
Title
The Advantages of Limiting P1687 to a Restricted Subset
Author
Doege, Jason ; Crouch, Alfred L.
Author_Institution
AMD, Austin, TX
fYear
2008
Firstpage
1
Lastpage
8
Abstract
Modern semiconductor designs include an incredible amount of embedded logic in the name of DFx (which is largely comprised of design-for-test, design-for-debug, and design-for-yield content and will be called "instruments" in this paper). Most of this logic has the IEEE 1149.1 (JTAG) Test Access Port (TAP) and the JTAG TAP Controller as its primary access mechanism or, if not the primary, as one of its access mechanisms. The IEEE P1687 (IJTAG) Working Group is working to create a standard to deal with the "instrument" interfaces and optimal connection schemes. Part of that effort includes dealing with legacy logic and what some users have claimed are inefficient 1149.1 embedded logic connection schemes. This paper explores the advantages and efficiencies of restricting the instrument interfaces and connection scheme to exclude most legacy schemes.
Keywords
design for testability; integrated circuit design; logic design; design-for-debug; design-for-test; design-for-yield content; embedded logic; limiting P1687; restricted subset; semiconductor designs; Built-in self-test; Circuit testing; Concurrent computing; Design for testability; Instruments; Logic design; Logic testing; Proposals; Registers; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700643
Filename
4700643
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