• DocumentCode
    1735906
  • Title

    The Advantages of Limiting P1687 to a Restricted Subset

  • Author

    Doege, Jason ; Crouch, Alfred L.

  • Author_Institution
    AMD, Austin, TX
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Modern semiconductor designs include an incredible amount of embedded logic in the name of DFx (which is largely comprised of design-for-test, design-for-debug, and design-for-yield content and will be called "instruments" in this paper). Most of this logic has the IEEE 1149.1 (JTAG) Test Access Port (TAP) and the JTAG TAP Controller as its primary access mechanism or, if not the primary, as one of its access mechanisms. The IEEE P1687 (IJTAG) Working Group is working to create a standard to deal with the "instrument" interfaces and optimal connection schemes. Part of that effort includes dealing with legacy logic and what some users have claimed are inefficient 1149.1 embedded logic connection schemes. This paper explores the advantages and efficiencies of restricting the instrument interfaces and connection scheme to exclude most legacy schemes.
  • Keywords
    design for testability; integrated circuit design; logic design; design-for-debug; design-for-test; design-for-yield content; embedded logic; limiting P1687; restricted subset; semiconductor designs; Built-in self-test; Circuit testing; Concurrent computing; Design for testability; Instruments; Logic design; Logic testing; Proposals; Registers; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700643
  • Filename
    4700643