DocumentCode
1736084
Title
Wafer level reliability (WLR) special interest group (SIG)
Author
Martin, Andreas
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
156
Lastpage
156
Keywords
Condition monitoring; Extrapolation; Failure analysis; Life testing; Nonvolatile memory; Plasma measurements; Plasma temperature; Qualifications; Sampling methods; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1999. IEEE International
Print_ISBN
0-7803-5649-7
Type
conf
DOI
10.1109/IRWS.1999.830586
Filename
830586
Link To Document