DocumentCode
1736178
Title
Jitters in high performance microprocessors
Author
Mak, T.M.
Author_Institution
Intel Corporation. t.m.mak@intel.com
fYear
2008
Firstpage
1
Lastpage
6
Abstract
High performance microprocessors work with very little cycle time, usually within few hundreds of picoseconds nowadays. Since generating and routing a multiple GHz clock system on the motherboard is usually not possible, microprocessor clock is usually generated on chip with a PLL. While this has been a great advancement, this is not all nirvana yet. As great as an on-chip PLL is, the clock still have to be distributed to every state elements (i.e. latches, flops) on the chip, which amounts to millions spread over an area of up to 15 mm square. Realistically, there is the consideration of clock skew and also inevitably the jittering of those clock edges. Both of these cut into the useful cycle time, forcing a reduction of performance. Even the mighty PLL, due to its analog operation in nature, is also affected by process variations and the worsening of transistor performance with process scaling over the last 40 years. While clock skews and jitters on a board can be monitored and analyzed clock skews and jitters on a chip pose great difficulty. We cannot improve what we cannot observe, hence the observing and monitoring clock skews and jitters have been synonymous with high performance design for the last 10 years. This tutorial will present the sources of these skews and jitters and how they manifest and impact the performance of microprocessors. We will also show the effect of scaling on transistor performance and how it impacts the clock system. We will also present solutions that have been developed to overcome these hurdles.
Keywords
clocks; microprocessor chips; phase locked loops; scaling circuits; timing jitter; PLL; clock edges; clock skew; high performance microprocessors; jitters; microprocessor clock; phase lock loop; process scaling; scaling effect; transistor performance; Clocks; Frequency; Jitter; Latches; Logic; Microprocessors; Monitoring; Phase locked loops; Routing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700650
Filename
4700650
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