Title :
Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment
Author :
Moreira, J. ; Barnes, Heidi ; Kaga, Hiroshi ; Comai, Michael ; Roth, Bernhard ; Culver, Morgan
Author_Institution :
Verigy, Singapore
Abstract :
State-of-the-art automated test equipment is now able to address I/O data rates in the 10 Gigabits-per-second (Gbps) data range. This is an achievement that remained the domain of racks of bench instrumentation and appeared very challenging for ATE systems until just a few years ago. With the I/O data rates of CMOS integrated circuits continuing to grow, the challenges for designing automated test equipment continue to increase. This paper provides a discussion of the signal integrity challenges that automated test equipment must surpass to successfully characterize future I/O interfaces that could even reach 40 Gbps.
Keywords :
CMOS integrated circuits; automatic test equipment; integrated circuit testing; ATE systems; CMOS integrated circuits; automated test equipment; future input-output interfaces; signal integrity; Automatic testing; Copper; Fixtures; High speed optical techniques; Instruments; Integrated circuit interconnections; Optical interconnections; Optical receivers; Silicon; Test equipment;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700651
