DocumentCode :
1736253
Title :
Charge sharing measurements of pixilated CdTe using Medipix-II chip
Author :
Chmeissani, M. ; Maiorino, M. ; Blanchot, G. ; Pellegrini, Giulio ; Garcia, J. ; Lozano, M. ; Martinez, R. ; Puigdengoles, C. ; Ullan, M.
Author_Institution :
Inst. de Fisica d´´Altes Energies, UAB Campus, Bellaterra, Spain
Volume :
1
fYear :
2004
Firstpage :
787
Abstract :
One important consideration of the design and the operation of pixilated detector is the ratio of the pixel size to the thickness of the detector. When the e-h pairs are generated and the charge drifts toward the pixel electrodes under the influence of the bias field, the charge spread is directly related to the drift time, which strongly depends on the carrier mobility and distance travelled by the carriers. This study has general impact on the design of pixilated detector; however its impact on the design and the operation of pixilated detector coupled to photon counting electronics is more profound. The results imply that designing a Cd(Zn)Te detector with very small pixel size, say 25μm and a detector 1 mm thick, is unrealistic because in reality such intrinsic fine spatial resolution can not be attained in the corresponding image due to charge sharing.
Keywords :
II-VI semiconductors; cadmium compounds; particle detectors; photon counting; silicon radiation detectors; CdTe; Medipix-II chip; bias field; carrier mobility; charge sharing measurements; charge spread; detector thckness; drift time; e-h pairs; fine spatial resolution; photon counting electronics; pixel electrodes; pixel size; pixilated detector; Charge measurement; Clouds; Collaboration; Current measurement; Detectors; Electrodes; Leak detection; Microelectronics; Semiconductor device measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-8248-X
Type :
conf
DOI :
10.1109/IMTC.2004.1351164
Filename :
1351164
Link To Document :
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