DocumentCode :
1736260
Title :
Single crystal nanoresonators at 100 MHz fabricated by a simple batch process
Author :
Tixier-Mita, A. ; Nakamura, K. ; Laine, A. ; Kawakatsu, H. ; Fujita, H.
Author_Institution :
Inst. of Ind. Sci., Tokyo Univ., Japan
Volume :
2
fYear :
2005
Firstpage :
1388
Abstract :
Nanoresonators with resonant frequency until 100 MHz and with Q-factors until 15000 were realized in a single crystal <100> standard silicon wafer, using standard UV photolithography and anisotropic etching with TMAH. Their cross-section is triangular, with edges following <111> and <100> planes, and they are aligned along the {110} direction. While the resonant frequency decreases with the increase of the length, as expected, the Q factor shows quite different values between the two tested batch process. This is due to the connecting parts of the resonators to the bulk, which differs in the two batch process, with one giving more dissipation losses than the other one.
Keywords :
Q-factor; batch processing (industrial); etching; micromechanical resonators; nanolithography; nanopatterning; silicon; ultraviolet lithography; 100 MHz; Q factor; TMAH; UV photolithography; anisotropic etching; dissipation loss; resonant frequency; simple batch process; single crystal nanoresonators; standard silicon wafer; triangular cross-section; Anisotropic magnetoresistance; Etching; Fabrication; Frequency conversion; Lithography; Q factor; Resonant frequency; Silicon; Standards development; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
Type :
conf
DOI :
10.1109/SENSOR.2005.1497340
Filename :
1497340
Link To Document :
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