Title :
Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model
Author_Institution :
Sun Microsyst. Inc., Sunnyvale, CA
Abstract :
How can we justify system level DFT? We must show that it has a positive return on investment (ROI). Existing test ROI models are manufacturing centric, do not account for the disaggregation of the product realization process, and are often focused on a specific DFT method. We propose a new, top-down, hierarchical ROI model, which starts with potential benefits and can handle entire systems more effectively than current models.
Keywords :
cost-benefit analysis; design for testability; integrated circuit design; integrated circuit testing; investment; DFT; ROI models; hierarchical top-down cost-benefit model; return on investment; Costs; Design for testability; Integrated circuit modeling; Integrated circuit testing; Manufacturing processes; Production facilities; Sun; System testing; Uncertainty; Virtual manufacturing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700656
