• DocumentCode
    1736301
  • Title

    Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model

  • Author

    Davidson, Scott

  • Author_Institution
    Sun Microsyst. Inc., Sunnyvale, CA
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    How can we justify system level DFT? We must show that it has a positive return on investment (ROI). Existing test ROI models are manufacturing centric, do not account for the disaggregation of the product realization process, and are often focused on a specific DFT method. We propose a new, top-down, hierarchical ROI model, which starts with potential benefits and can handle entire systems more effectively than current models.
  • Keywords
    cost-benefit analysis; design for testability; integrated circuit design; integrated circuit testing; investment; DFT; ROI models; hierarchical top-down cost-benefit model; return on investment; Costs; Design for testability; Integrated circuit modeling; Integrated circuit testing; Manufacturing processes; Production facilities; Sun; System testing; Uncertainty; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700656
  • Filename
    4700656