DocumentCode
1736301
Title
Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model
Author
Davidson, Scott
Author_Institution
Sun Microsyst. Inc., Sunnyvale, CA
fYear
2008
Firstpage
1
Lastpage
10
Abstract
How can we justify system level DFT? We must show that it has a positive return on investment (ROI). Existing test ROI models are manufacturing centric, do not account for the disaggregation of the product realization process, and are often focused on a specific DFT method. We propose a new, top-down, hierarchical ROI model, which starts with potential benefits and can handle entire systems more effectively than current models.
Keywords
cost-benefit analysis; design for testability; integrated circuit design; integrated circuit testing; investment; DFT; ROI models; hierarchical top-down cost-benefit model; return on investment; Costs; Design for testability; Integrated circuit modeling; Integrated circuit testing; Manufacturing processes; Production facilities; Sun; System testing; Uncertainty; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700656
Filename
4700656
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