DocumentCode :
1736321
Title :
Spectroscopic determination of W I and W II oscillator strengths
Author :
Michelt, B. ; Sielker, R. ; Mentel, J.
Author_Institution :
Ruhr-Univ., Bochum, Germany
fYear :
1997
Firstpage :
148
Abstract :
Summary form only given, as follows. Oscillator strengths of 43 W I and 27 W II lines in the wavelength range 240-560 nm have been measured with a wall-stabilized arc. The arc was operated at 10-80 A in argon at atmospheric pressure with an admixture of tungsten hexafluoride. A set of relative W I and W II f-values was determined by a combination of emission and absorption measurements with a special optical setup. The qualities of these measurements do not require any assumptions concerning the plasma state. The relative set of 43 W I lines has been converted to an absolute scale by means of radiative lifetimes. The overall uncertainties of these oscillator strengths are within 10% for strong up to 36% for weak lines. The relative oscillator strengths of 9 W II lines have also been converted by using the radiative lifetimes of the upper levels. Because of missing lifetime data the absolute oscillator strengths of 18 W II lines had to be determined with the aid of temperature measurement under the assumption of a Boltzmann distribution. The absolute error for these f-values lies between 7% and 17%.
Keywords :
oscillator strengths; plasma diagnostics; plasma properties; positive ions; radiative lifetimes; spectroscopy; tungsten; 240 to 560 nm; Ar; Boltzmann distribution; W; W I; W II; W/sup +/; WF/sub 6/ admixture; absolute error; absorption measurements; atmospheric pressure; emission measurements; f-values; optical setup; oscillator strengths; plasma state; radiative lifetimes; spectroscopic determination; wall-stabilized arc; Absorption; Argon; Atmospheric measurements; Atmospheric waves; Oscillators; Plasma measurements; Spectroscopy; Stimulated emission; Tungsten; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.604443
Filename :
604443
Link To Document :
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