• DocumentCode
    1736379
  • Title

    Power-Aware DFT - Do Not Risk It, Use It

  • Author

    Pouya, Bahram

  • Author_Institution
    Freescale Semicond., Inc., Austin, TX
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Power-aware DFT can mean different things to different people. In order to make any definitive statements and answer the panel question of whether we really need power-aware DFT, let us first try to define and understand the problem of test and power and what power-aware DFT means.
  • Keywords
    design for testability; power aware computing; controlling power; design & production flow; design for testability; integral part; power-aware DFT; production test; Built-in self-test; Costs; Design for testability; Energy management; Hardware; Logic testing; Power generation; Production; Test pattern generators; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700660
  • Filename
    4700660
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1736379