DocumentCode :
1736379
Title :
Power-Aware DFT - Do Not Risk It, Use It
Author :
Pouya, Bahram
Author_Institution :
Freescale Semicond., Inc., Austin, TX
fYear :
2008
Firstpage :
1
Lastpage :
1
Abstract :
Power-aware DFT can mean different things to different people. In order to make any definitive statements and answer the panel question of whether we really need power-aware DFT, let us first try to define and understand the problem of test and power and what power-aware DFT means.
Keywords :
design for testability; power aware computing; controlling power; design & production flow; design for testability; integral part; power-aware DFT; production test; Built-in self-test; Costs; Design for testability; Energy management; Hardware; Logic testing; Power generation; Production; Test pattern generators; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2008.4700660
Filename :
4700660
Link To Document :
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