Title :
Analog Test Technology: Stable and Grounded, or Open Loop and Spurious?
Author :
Purtell, Michael
Author_Institution :
Intersil Corp., Milpitas, CA
Abstract :
The op-amp test loop used in the 1970s is still in use today. In the early 1980s, Matt Mahoney won best paper and honorable mention awards at this conference for ground breaking work in the area of analog and DSP based testing. While devices have evolved over the years in terms of speed, precision, and integration on SOC chips, almost all of the test techniques created by the early leaders are still in use today.
Keywords :
analogue circuits; digital signal processing chips; operational amplifiers; system-on-chip; DSP based testing; SOC chips; analog based testing; analog test technology; op-amp test loop; Built-in self-test; Circuit testing; Digital signal processing chips; Filters; Image converters; Operational amplifiers; Probes; Radiofrequency amplifiers; System testing; USA Councils;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700662
