Title :
Two DOF temperature control using RBFNN for stretch PET blow molding machines
Author :
Ching-Chih Tsai ; Ya-Ling Chang ; Shun-Liang Tung
Author_Institution :
Dept. of Electr. Eng., Nat. Chung-Hsing Univ., Taichung, Taiwan
Abstract :
This paper presents a novel two degrees-of-freedom (DOF) digital controller using radial basis function neural network (RBFNN) for a stretch polyethylene-terephthalate (PET) blow molding machine, in order to achieve satisfactory temperature control of the PET bottle performs passing through both heating ovens. The proposed two-DOF controller is composed of a feedforward controller used to improve the transient performance and track quickly temperature setpoints, and an RBFNN self-tuning digital proportional-integral- derivative (PID) controller employed to eliminate remaining temperature errors and achieve disturbances rejection. Such a controller not only retains the practical expertise of the control practitioners working for PET blow molding machines, but also keeps automatic tuning ability of the PID controller parameters. Finally, the computer simulation and experimental result reveal disturbance rejection and good setpoint tracking performance of the proposed control method. The results clearly indicate effectiveness and merit of the proposed method.
Keywords :
blow moulding; digital control; radial basis function networks; self-adjusting systems; temperature control; three-term control; PET bottle; PID controller; RBFNN; heating ovens; radial basis function neural network; self-tuning digital proportional-integral- derivative controller; stretch PET blow molding machines; stretch polyethylene-terephthalate; two DOF temperature control; two degrees-of-freedom digital controller; Artificial neural networks; Feedforward neural networks; Heating; Ovens; Positron emission tomography; Process control; Blow molding process; PID control; RBFNN; feedforward control; temperature control; two degrees-of-freedom (DOF) control;
Conference_Titel :
Systems, Man and Cybernetics (SMC), 2014 IEEE International Conference on
Conference_Location :
San Diego, CA
DOI :
10.1109/SMC.2014.6974171