DocumentCode :
1736455
Title :
Analog Test Technology: Challenges Abound
Author :
Anderson, Thomas J.
Author_Institution :
Teradyne, Inc, San Jose, CA
fYear :
2008
Firstpage :
1
Lastpage :
1
Abstract :
When the author began his career as an analog test engineer in the semiconductor industry, testing was considered an annoying necessity. Today, test and assembly is the largest cost factor of a device, so it receives more attention, but is still a controversial subject. The author have encountered customers that feel some parameter testing takes too long, so they ignore the test altogether, even if required by standards committees, until they are hit with lawsuits and/or zero yield problems.
Keywords :
analogue integrated circuits; integrated circuit testing; analog test technology; digital signal processing; predictive measurement; semiconductor industry; Assembly; Bandwidth; Circuit testing; Costs; Digital signal processing; Electronic equipment testing; Electronics industry; Engineering profession; Instruments; Semiconductor device testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2008.4700664
Filename :
4700664
Link To Document :
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