• DocumentCode
    1736463
  • Title

    Analog & Mixed-Signal are Key for Test Development Engineering Program

  • Author

    Schmitz, Tamara I.

  • Author_Institution
    Intersil Milpitas, Milpitas, CA
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Analog and mixed-signal test are long-standing industries. While polling industry contacts about the most needed focus for practical education in college, debugging and test methods were at the top of the list. The following program was developed as a result. The strong and consistent dedication to analog methods and experience confirms industry´s continued need for them.
  • Keywords
    educational institutions; electronic engineering education; integrated circuit testing; mixed analogue-digital integrated circuits; analog signal testing; college; debugging methods; mixed-signal testing; practical education; test development engineering program; test methods; Automatic testing; Built-in self-test; Circuit testing; Debugging; Educational institutions; Educational programs; Operational amplifiers; Resistors; Semiconductor device testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700665
  • Filename
    4700665