Title :
Will Test Compression Run Out of Gas?
Author :
Goel, Sandeep Kumar ; Marinissen, Erik Jan
Author_Institution :
Adv. Defect Screening Dept., LSI, Milpitas, CA
Abstract :
This panel addresses the question if test data compression was only a temporary fix, or a truly future-proof solution. Interoperability, low-power test, high-volume diagnosis, digital vs. analog testing, built-in self-test and low-cost ATEs will all be discussion in the scope of the future of test compression.
Keywords :
built-in self test; circuit testing; data compression; analog testing; built-in self-test; data compression; digital testing; future-proof solution; high-volume diagnosis; low-power test; test compression; Automatic test pattern generation; Automatic testing; Built-in self-test; Costs; Hardware; Logic testing; Marine technology; Radio frequency; Technological innovation; Test data compression;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700666
