DocumentCode :
1736596
Title :
Gray-scale lithography using mask-less exposure system
Author :
Totsu, Kentaro ; Fujishiro, Kenta ; Tanaka, Shuji ; Esashi, Masayoshi
Author_Institution :
Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
Volume :
2
fYear :
2005
Firstpage :
1441
Abstract :
A fabrication process of precisely controlled three-dimensional patterns using a gray-scale lithography is presented. Multi-layered exposure patterns digitally generated by a mask-less exposure system are superposed on a photoresist-coated substrate layer by layer. Changing the exposure patterns and the exposure time of each exposure make the precise control of the profile of ultraviolet dose possible. The mask-less exposure system realizes fabrication of variable three-dimensional patterns at low cost with saving time. Photoresist patterns of spherical and aspherical microlens array of 100 μm in each diameter are fabricated. The patterns are successfully transferred into silicon substrates with reactive ion etching.
Keywords :
aspherical optics; microlenses; optoelectronic devices; photoresists; silicon; sputter etching; substrates; 100 micron; 3D pattern; Si; aspherical microlens array; fabrication; gray-scale lithography; maskless exposure system; multilayered exposure pattern; photolithography; photoresist pattern; photoresist-coated substrate; reactive ion etching; silicon substrate; ultraviolet dose profile; Costs; Etching; Fabrication; Gray-scale; Lenses; Lithography; Microoptics; Process control; Resists; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
Type :
conf
DOI :
10.1109/SENSOR.2005.1497353
Filename :
1497353
Link To Document :
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