DocumentCode :
1736607
Title :
Matching considerations in I/Q A/D converter pairs
Author :
Peach, Charles T. ; Law, Waisiu ; Beck, Douglas R. ; Helms, Ward J. ; Allstot, David J.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume :
3
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Abstract :
Data characterizing the relationship between image reject ratio (IRR) and process mismatches in pipeline analog-to-digital converter (ADC) pairs is presented. The general high-level simulation model consists of two pipeline ADCs in parallel placed in an environment that resembles the I- and Q-channels of an RF receiver. Inserting normally distributed mismatches into the components of each ADC provides data that monitors any correlation between these mismatches and the IRR. This correlation was observed under a variety of conditions and calibration techniques. In particular, simulation evidence suggests that digital calibration techniques aimed at assisting linearity actually reduce the efficacy of I- and Q-channel image rejection.
Keywords :
analogue-digital conversion; calibration; circuit simulation; pipeline processing; I/Q A/D converter pairs; digital calibration techniques; high-level simulation model; image reject ratio; matching considerations; normally distributed mismatches; pipeline analog-to-digital converter pairs; process mismatches; Analog-digital conversion; Bandwidth; Calibration; Contracts; Design optimization; Image converters; Image sampling; Linearity; Pipelines; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
Type :
conf
DOI :
10.1109/ISCAS.2002.1010181
Filename :
1010181
Link To Document :
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