DocumentCode
1736656
Title
Yield Learning: Everybody Gains, But Who Picks up the Tab?
Author
Burlison, Phil
Author_Institution
Verigy Ltd., Cupertino, CA
fYear
2008
Firstpage
1
Lastpage
1
Abstract
There has been a lot of discussion about the need for expanding test into a more active role in yield learning, and the various technical and other challenges that such a role may create. This panel will attempt to better quantify the benefits for the companies involved - to span various business models. Who gains? Who bears the burden of the cost of change?
Keywords
integrated circuit yield; semiconductor device manufacture; defect detection; semiconductor product quality; yield learning; Companies; Costs; Foundries; Inspection; Optical filters; Optical sensors; Process design; Quality management; Semiconductor device modeling; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700673
Filename
4700673
Link To Document