Title :
Yield Learning: Everybody Gains, But Who Picks up the Tab?
Author_Institution :
Verigy Ltd., Cupertino, CA
Abstract :
There has been a lot of discussion about the need for expanding test into a more active role in yield learning, and the various technical and other challenges that such a role may create. This panel will attempt to better quantify the benefits for the companies involved - to span various business models. Who gains? Who bears the burden of the cost of change?
Keywords :
integrated circuit yield; semiconductor device manufacture; defect detection; semiconductor product quality; yield learning; Companies; Costs; Foundries; Inspection; Optical filters; Optical sensors; Process design; Quality management; Semiconductor device modeling; Testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700673
