DocumentCode :
1736700
Title :
A fault tolerant incremental design methodology
Author :
Cailotto, Stefano ; Fin, Alessandro ; Fummi, Franco
Author_Institution :
Dipt. di Informatica, Universita di Verona, Italy
Volume :
3
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Abstract :
Incremental design is the widest applied methodology for VLSI design since, it allows one to produce early versions of the system that, even if not satisfying all requirements, allow one to verify its applicability in the field. The migration from, a system version to a more powerful one is based on the substitution of a module with a more powerful module, which implements new features. This upgrade can introduce errors, which are difficult to be identified during the design since the standard concept of equivalence checking cannot be applied in this context. In fact, the original and the redesigned module can implement different specifications or can achieve the same results under different timing constraints. The paper analyzes this problem and proposes a fault tolerant incremental design methodology able to reduce or avoid such errors.
Keywords :
VLSI; circuit CAD; fault tolerant computing; integrated circuit design; timing; VLSI; applicability; design methodology; equivalence checking; errors; fault tolerant incremental design; timing constraints; Delay; Design methodology; Digital systems; Fault tolerance; Humans; Mobile communication; Mobile handsets; Testing; Timing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
Type :
conf
DOI :
10.1109/ISCAS.2002.1010185
Filename :
1010185
Link To Document :
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