Title :
Benchmarking Academic DFT Tools on the OpenSparc Microprocessor
Author :
Polian, Ilia ; Miller, Christian ; Engelke, Piet ; Nopper, Tobias ; Czutro, Alejandro ; Becker, Bernd
Author_Institution :
Inst. for Comput. Sci., Albert-Ludwigs-Univ., Freiburg
Abstract :
The academia largely relies on two classes of circuits to benchmark its developments in the field of DFT. The first class are academic benchmarks such as ISCAS-85 [1], ISCAS-89 [2] and ITC-99 [3] circuits. They are reasonably old and thus significantly smaller than today´s realistic designs. Furthermore, their characteristics may not match the properties of recent designs. This might facilitate developments which are not useful for current circuits. For instance, ISCAS-85 circuits tend to have many reconvergen- cies and thus a huge number of paths through combinational logic. This triggered adding functionality handling recon- vergencies efficiently to academic test generation tools. This functionality may not be highly relevant in today´s practice
Keywords :
design for testability; logic design; microprocessor chips; ISCAS-85; ISCAS-89; ITC-99; OpenSparc microprocessor; academic test generation tools; design for testability; Application software; Benchmark testing; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Computational modeling; Microprocessors; Test pattern generators;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700677