DocumentCode
1736794
Title
`Double´ subgraph isomorphism method for matching LSI chip images
Author
Wang, Ji-Ren ; Li, Jie-gu
Author_Institution
Dept. of Electron. Sci. & Technol., East China Normal Univ., Shanghai, China
fYear
1988
Firstpage
945
Abstract
The corresponding relations between two nodes isomorphically matched are searched from the region adjacency graph of segmented chip images. Heuristic information is extracted to improve the searching efficiency in the isomorphism matching. Special criteria of region similarity measure and matching figure of surrounding string are used to select starting nodes of isomorphism matching
Keywords
computer vision; computerised pattern recognition; computerised picture processing; graph theory; heuristic programming; inspection; large scale integration; LSI chip images; computer vision; computerised picture processing; double subgraph isomorphism; heuristic information; image matching; isomorphism matching; pattern recognition; region adjacency graph; region similarity measure; searching efficiency; segmented chip images; surrounding string matching; Data mining; Image edge detection; Image processing; Image sampling; Image segmentation; Large scale integration; Lighting; Optical distortion; Pattern recognition; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1988., 9th International Conference on
Conference_Location
Rome
Print_ISBN
0-8186-0878-1
Type
conf
DOI
10.1109/ICPR.1988.28409
Filename
28409
Link To Document