• DocumentCode
    1736899
  • Title

    IEEE P1581 drastically simplifies connectivity test for memory devices

  • Author

    Ehrenberg, Heiko

  • Author_Institution
    GOEPEL Electron., Austin, TX
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This poster provides an overview of IEEE P1581, for those not familiar with this standardization effort, and gives a status update of the IEEE P1581 specification development. We will also provide examples for the implementation of IEEE P1581 capabilities in SRAM, DRAM, and FLASH devices.
  • Keywords
    DRAM chips; IEEE standards; SRAM chips; flash memories; DRAM; FLASH devices; IEEE P1581 specification development; SRAM; memory devices; Automatic testing; Circuit faults; Circuit testing; Electronic equipment testing; Integrated circuit technology; Integrated circuit testing; Logic testing; Random access memory; Read-write memory; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700681
  • Filename
    4700681
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1736899