Title :
IEEE P1581 drastically simplifies connectivity test for memory devices
Author :
Ehrenberg, Heiko
Author_Institution :
GOEPEL Electron., Austin, TX
Abstract :
This poster provides an overview of IEEE P1581, for those not familiar with this standardization effort, and gives a status update of the IEEE P1581 specification development. We will also provide examples for the implementation of IEEE P1581 capabilities in SRAM, DRAM, and FLASH devices.
Keywords :
DRAM chips; IEEE standards; SRAM chips; flash memories; DRAM; FLASH devices; IEEE P1581 specification development; SRAM; memory devices; Automatic testing; Circuit faults; Circuit testing; Electronic equipment testing; Integrated circuit technology; Integrated circuit testing; Logic testing; Random access memory; Read-write memory; System testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700681
