• DocumentCode
    1737060
  • Title

    NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure

  • Author

    Alaghi, Armin ; Sedghi, Mahshid ; Karimi, Naghmeh ; Navabi, Zainalabedin

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Tehran, Tehran
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This paper proposes an offline test strategy for finding the largest fault-free connected sub-structure of a mesh-based NoC. Faulty switch ports are found by flooding the NoC with test packets. Then, NoC routers are reconfigured according to the degraded NoC structure to route incoming packets.
  • Keywords
    fault trees; logic testing; network routing; network-on-chip; NoC routers; NoC testing; fault-free connected substructure; faulty switch ports; mesh-based NoC reconfiguration; Circuit faults; Circuit testing; Degradation; Fault detection; Floods; Network-on-a-chip; Packet switching; Routing; Space exploration; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700688
  • Filename
    4700688
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1737060