DocumentCode :
1737143
Title :
A hybrid (logic+I/sub DDQ/) testing strategy using an iterative bridging fault filtering scheme
Author :
Tzuhao Chen ; Hajj, I.N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
1997
Firstpage :
63
Lastpage :
67
Abstract :
In this paper we propose a new hybrid (logic+I/sub DDQ/) testing strategy for efficient bridging fault (BF) detection. In our strategy, logic and I/sub DDQ/ testings are applied in sequence so that BFs that can be detected by the logic testing need not be targeted by the I/sub DDQ/ testing. The logic test generation is done via an iterative BF filtering in which fault coverage is maximized through test set augmentation. As a result only a small number of BFs need to be targeted by the I/sub DDQ/ test generator. Experiments show that this approach is capable of reaching very high BF coverage with a composite (logic+I/sub DDQ/) test set with very few I/sub DDQ/ vectors.
Keywords :
logic testing; I/sub DDQ/ test generator; bridging fault detection; fault coverage; hybrid testing strategy; iterative bridging fault filtering scheme; logic test generation; test set augmentation; Circuit faults; Circuit testing; Filtering; Integrated circuit testing; Logic testing; Manufacturing; Sequential analysis; Sequential circuits; VHF circuits; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-8123-3
Type :
conf
DOI :
10.1109/IDDQ.1997.633015
Filename :
633015
Link To Document :
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