Title :
An Efficient Secure Scan Design for an SoC Embedding AES Core
Author :
Song, Jaehoon ; Jung, Taejin ; Lee, Junseop ; Jeong, Hyeran ; Kim, Byeongjin ; Park, Sungju
Author_Institution :
Dept. of Comput. Sci. & Eng., Hanyang Univ.
Abstract :
This poster presents an efficient secure scan design based on a fake key to protect a secret key from scan-based side channel attack. This technique targeted for an SoC embedding an Advanced Encryption Standard (AES) core can be adopted without requiring any modification to the functional body of the IP core, thus overheads for area, timing, and power are negligible while preserving the compatibility with the IEEE1149.1 standard.
Keywords :
IEEE standards; cryptography; design for testability; system-on-chip; IEEE1149.1 standard; IP core; advanced encryption standard; design for test; secure scan design; side channel attack; Computer science; Cryptography; Design engineering; Design for testability; Hardware; Information retrieval; Power engineering and energy; Protection; Testing; Timing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700693
