Title :
Is It Cost-Effective to Achieve Very High Fault Coverage for Testing Homogeneous SoCs with Core-Level Redundancy?
Author :
Huang, Lin ; Xu, Qiang
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong
Abstract :
This work argues to reduce the production cost of homogeneous SoCs by introducing dedicated test cost-driven redundant cores. By doing so, the fault coverage for each core and hence the SoC test cost can be dramatically reduced, which is able to compensate the manufacturing cost of the extra cores. A case study is presented to demonstrate the effectiveness of the proposed scheme.
Keywords :
integrated circuit reliability; integrated circuit testing; system-on-chip; core-level redundancy; dedicated test cost-driven redundant cores; homogeneous SoC; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Costs; Laboratories; Manufacturing; Production; Redundancy; Test pattern generators;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700697
