Title :
System JTAG Initiative Group Advancements
Author :
Treuren, Bradford G Van
Author_Institution :
Alcatel-Lucent, Murray Hill, NJ
Abstract :
The SJTAG Initiative Group has been actively analyzing and mining common methods/procedures/interfaces through use case analysis over the domains identified as the SJTAG Universe. This poster summarizes the partitions/interfaces/data found.
Keywords :
boundary scan testing; System JTAG Initiative Group; boundary-scan vector languages; return on investment; system-level boundary-scan activities; Automatic testing; Built-in self-test; Data analysis; Embedded software; Failure analysis; Fault diagnosis; Instruments; Software debugging; Software testing; System testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700698
