• DocumentCode
    1737313
  • Title

    System JTAG Initiative Group Advancements

  • Author

    Treuren, Bradford G Van

  • Author_Institution
    Alcatel-Lucent, Murray Hill, NJ
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The SJTAG Initiative Group has been actively analyzing and mining common methods/procedures/interfaces through use case analysis over the domains identified as the SJTAG Universe. This poster summarizes the partitions/interfaces/data found.
  • Keywords
    boundary scan testing; System JTAG Initiative Group; boundary-scan vector languages; return on investment; system-level boundary-scan activities; Automatic testing; Built-in self-test; Data analysis; Embedded software; Failure analysis; Fault diagnosis; Instruments; Software debugging; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700698
  • Filename
    4700698
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1737313