Title :
Component rating requirements for wide constant power operation of interior PM synchronous machine drives
Author :
Jahns, Thomas M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
Previous work has established that wide ranges of constant power operation can be achieved with interior permanent magnet (IPM) synchronous machine drives when the machine parameters meet or approach the critical condition Ψm/Ld=Irated. Closer examination reveals that the machine parameters also play a pivotal role in determining the necessary ratings of the inverter and the machine to achieve any particular value of constant-power speed ratio (CPSR). The purpose of this paper is to methodically describe the impact of the IPM machine parameters on the inverter and machine ratings in order to clarify the dependencies and tradeoffs that are involved in achieving wide ranges of constant-power operation, The importance of maintaining the values of the IPM machine´s magnet flux linkage Ψm and inductance saliency ratio ξ(=Lq/Ld) close to the optimal constant-power design locus line is explained as a means of minimizing the inverter component overratings (i.e., cost). However, tradeoffs emerge between inverter and machine overrating factors that must be considered in the process of minimizing the total system cost
Keywords :
DC-AC power convertors; invertors; machine theory; magnetic flux; permanent magnet motors; permanent magnets; synchronous motor drives; component rating requirements; constant-power speed ratio; cost minimisation; critical condition; inductance saliency ratio; interior PM synchronous machine drives; invertor ratings; machine parameters; machine ratings; magnet flux linkage; optimal constant-power design locus line; overrating factors; wide constant power operation; Costs; Couplings; Drives; Inductance; Inverters; Magnetic flux; Permanent magnets; Production; Synchronous machines; Torque;
Conference_Titel :
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location :
Rome
Print_ISBN :
0-7803-6401-5
DOI :
10.1109/IAS.2000.882109