Title :
Comparison among high-frequency and line-frequency commutated rectifiers complying with IEC 61000-3-2 standards
Author :
Pomilio, José Antenor ; Spiazzi, Giorgio ; Buso, Simone
Author_Institution :
Sch. of Electr. & Comput. Eng., Campinas Univ., Brazil
Abstract :
High power factor rectifiers, complying with IEC 61000-3-2 standards have been studied. Two main approaches are usually used: high frequency control of the input current (as in PFCs) and line-frequency commutated rectifiers. The latter represent an interesting solution for large volume applications which do not need a precise output voltage regulation. They provide compliance with a smaller overall reactive component volume as compared to conventional rectifiers with a passive L-C filter. Moreover, with the switch being turned on and off only twice per line period, the associated losses are very small and the di/dt and dv/dt can be lowered compared to high-frequency commutated rectifiers, thus reducing the high-frequency noise emission and EMI filter requirements. This paper reviews the operating principles of some line-frequency commutated rectifier topologies highlighting their merits and limitations. A comparison among low and high frequency high power factor rectifiers, in terms of circuit complexity, overall reactive component size and performance, is made, thus allowing selection of the most convenient topology for a given application
Keywords :
IEC standards; commutation; losses; power factor correction; rectifying circuits; IEC 61000-3-2 standards; high frequency control; high frequency high power factor rectifiers; high-frequency commutated rectifiers; input current; line-frequency commutated rectifiers; losses; low frequency high power factor rectifiers; operating principles; output voltage regulation; overall reactive component volume; switch; Circuit noise; Circuit topology; Frequency control; IEC standards; Noise reduction; Passive filters; Reactive power; Rectifiers; Switches; Voltage control;
Conference_Titel :
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location :
Rome
Print_ISBN :
0-7803-6401-5
DOI :
10.1109/IAS.2000.883133