• DocumentCode
    1738071
  • Title

    Finite element modeling of heat transfer and thermal stresses for three-dimensional packaging of power electronics modules

  • Author

    Wen, Simon S. ; Lu, Guo-Quan

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    496
  • Abstract
    The state-of-the-art packaging technology for power electronics modules uses wire bonds to interconnect power devices. Emerging 3-D interconnected power package designs have shown their advantages over conventional wire bonding modules in higher power density, reduced interconnect resistance and parasitic oscillations, better thermal management, higher level of system integration and lower cost. The authors attempt to eliminate the use of wire bonds has led to the development of a three-dimensional, stacked-plate technique. With this technique, thick metal posts are directly soldered onto power devices to form an interconnected `flat-pack´ package that potentially offers improved electrical and thermal performance. On the other hand, high-density 3-D power modules experience more stringent environmental conditions such as thermal cycles during the fabrication and operation. Due to different thermal expansion coefficients (CTE) in different materials, cyclic stresses may lead to thermal fatigue and failure of power modules. A study in this respect will help understanding the key issues of thermal management and thermo-mechanical reliability for 3-D power electronic packaging. In this paper, the authors present a finite-element modeling of thermal and thermomechanical behavior in a power module fabricated by this technique
  • Keywords
    finite element analysis; heat transfer; power electronics; soldering; thermal analysis; thermal management (packaging); 3-D interconnected power package designs; 3-D power electronics modules packaging; cyclic stresses; finite element modeling; heat transfer; interconnect resistance; interconnected flat-pack package; parasitic oscillations; power density; power device interconnects; soldering; state-of-the-art packaging technology; thermal expansion coefficients; thermal fatigue; thermal management; thermal stresses; thermo-mechanical reliability; thermomechanical behavior; thick metal posts; wire bonds; Electronic packaging thermal management; Finite element methods; Heat transfer; Multichip modules; Power electronics; Power system interconnection; Thermal management; Thermal resistance; Thermal stresses; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference, 2000. Proceedings. IPEMC 2000. The Third International
  • Conference_Location
    Beijing
  • Print_ISBN
    7-80003-464-X
  • Type

    conf

  • DOI
    10.1109/IPEMC.2000.885456
  • Filename
    885456