DocumentCode :
173819
Title :
Exploring day-to-day variability in EEG-based emotion classification
Author :
Yuan-Pin Lin ; Tzyy-Ping Jung
Author_Institution :
Inst. for Neural Comput. & Inst. of Eng. in Med., Univ. of California San Diego, La Jolla, CA, USA
fYear :
2014
fDate :
5-8 Oct. 2014
Firstpage :
2226
Lastpage :
2229
Abstract :
The research of electroencephalography (EEG)-based emotion classification has gained much popularity in the past few years. Researchers continue to seek an optimal machine learning-based pipeline to characterize the associations between complex spatio-spectral EEG dynamics and implicit emotional responses. However, toward a real-life application, addressing the inherent day-to-day variability in EEG signals is also of urgent importance, yet was less concerned in the literature. This study explored the day-to-day EEG variability and tested the feasibility of developing an emotion-classification pipeline that can account for such variability. The empirical results of this study showed that the use of a proper feature extraction, e.g., band-power asymmetries over the fronto-posterior regions, in conjunction with an effective artifact removal method, e.g., independent component analysis, could alleviate the impacts of inter-day variability and improve the classification performance.
Keywords :
electroencephalography; emotion recognition; independent component analysis; learning (artificial intelligence); medical signal processing; artifact removal method; band-power asymmetry; complex spatio-spectral EEG dynamics; day-to-day EEG variability; electroencephalography; emotion classification; feature extraction; implicit emotional response; independent component analysis; optimal machine learning-based pipeline; Brain modeling; Electroencephalography; Feature extraction; Independent component analysis; Music; Pipelines; Training data; EEG-based emotion classification; day-to-day variability; independent component analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man and Cybernetics (SMC), 2014 IEEE International Conference on
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/SMC.2014.6974255
Filename :
6974255
Link To Document :
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