• DocumentCode
    1738712
  • Title

    Efficient error correction code configurations for quasi-nonvolatile data retention by DRAMs

  • Author

    Katayama, Yasunao ; Negishi, Yasushi ; Morioka, Sumio

  • Author_Institution
    IBM Res., Kanagawa, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    201
  • Lastpage
    209
  • Abstract
    This paper presents analyses of various configurations of error correction codes for the purpose of reducing the parity area for quasi-nonvolatile data retention by DRAMs. By combining long and short error correction codes, we show that the parity area can be reduced to less than 1% of the total memory size, yet the system can offer comparable reliability and adaptability as an earlier design that requires 12.5% parity area. We also claim that even without using any area for parity data, the adaptive control of the DRAM refresh rate can reduce the total risk of data loss. Finally, we discuss an efficient decoder design for long RS codes
  • Keywords
    DRAM chips; Reed-Solomon codes; adaptive control; decoding; error correction codes; DRAM refresh rate; DRAMs; ECC configurations; adaptive control; decoder design; error correction code configurations; long ECCs; long RS codes; memory size; parity area reduction; quasi-nonvolatile data retention; short ECCs; Adaptive control; Application software; Bit error rate; Costs; Decoding; Error correction codes; Laboratories; Pervasive computing; Power system reliability; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
  • Conference_Location
    Yamanashi
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0719-0
  • Type

    conf

  • DOI
    10.1109/DFTVS.2000.887158
  • Filename
    887158