DocumentCode :
1738743
Title :
New experimental findings on hot carrier effects in deep submicrometer surface channel PMOS
Author :
Jong Tae Park ; Jang, Sung Jun ; Yu, Chong Gun ; Byung Gook Park ; Lee, Jong Duk
Author_Institution :
Seoul National University
fYear :
1996
fDate :
1996
Firstpage :
1659
Lastpage :
1662
Keywords :
CMOS technology; Degradation; Feedback; Hot carrier effects; Hot carriers; Impact ionization; Low voltage; MOS devices; Semiconductor device modeling; Substrate hot electron injection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
Type :
conf
DOI :
10.1109/ESREF.1996.888185
Filename :
888185
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1738743
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