DocumentCode
1738743
Title
New experimental findings on hot carrier effects in deep submicrometer surface channel PMOS
Author
Jong Tae Park ; Jang, Sung Jun ; Yu, Chong Gun ; Byung Gook Park ; Lee, Jong Duk
Author_Institution
Seoul National University
fYear
1996
fDate
1996
Firstpage
1659
Lastpage
1662
Keywords
CMOS technology; Degradation; Feedback; Hot carrier effects; Hot carriers; Impact ionization; Low voltage; MOS devices; Semiconductor device modeling; Substrate hot electron injection;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888185
Filename
888185
Link To Document