DocumentCode
1738747
Title
Influence of parasitic structures on the ESD performance of a pure bipolar process
Author
Nikolaidïs, T. ; Richier, C. ; Reffay, M. ; Mortini, P. ; Pananakakis, G.
Author_Institution
SGS-Thomson Microelectronics
fYear
1996
fDate
1996
Firstpage
1723
Lastpage
1726
Keywords
BiCMOS integrated circuits; Biological system modeling; Bipolar integrated circuits; Circuit testing; Electrostatic discharge; Integrated circuit testing; Protection; Resistors; Semiconductor diodes; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888201
Filename
888201
Link To Document