DocumentCode :
1738751
Title :
DC9, LF dispersion and HF characterisation of short-time stressed inp based LM-HEMTS
Author :
Schreurs, D. ; Spiers, A. ; De Raedt, W. ; Van der Zandem, K. ; Baeyens, Y. ; Van Hove, M. ; Nauwelaers, B. ; Van Rossum, M.
Author_Institution :
K.U. Leuven, Div. ESAT-TELEMIC
fYear :
1996
fDate :
1996
Firstpage :
1911
Lastpage :
1914
Keywords :
Failure analysis; HEMTs; Hafnium; Impact ionization; Indium phosphide; Intrusion detection; MODFETs; Scattering parameters; Temperature; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
Type :
conf
DOI :
10.1109/ESREF.1996.888244
Filename :
888244
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1738751
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