DocumentCode
1738751
Title
DC9, LF dispersion and HF characterisation of short-time stressed inp based LM-HEMTS
Author
Schreurs, D. ; Spiers, A. ; De Raedt, W. ; Van der Zandem, K. ; Baeyens, Y. ; Van Hove, M. ; Nauwelaers, B. ; Van Rossum, M.
Author_Institution
K.U. Leuven, Div. ESAT-TELEMIC
fYear
1996
fDate
1996
Firstpage
1911
Lastpage
1914
Keywords
Failure analysis; HEMTs; Hafnium; Impact ionization; Indium phosphide; Intrusion detection; MODFETs; Scattering parameters; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888244
Filename
888244
Link To Document