Title :
Characterization of coupled lines manufactured on thin dielectric membranes using electromagnetic simulations
Author :
Neculoiu, D. ; Marcelli, R. ; Bartolucci, G. ; Simion, G. ; Iordanescu, S. ; Muller, A.L.
Author_Institution :
Politehnica Univ. of Bucharest, Romania
Abstract :
A novel approach for the characterization of coupled transmission lines fabricated on thin dielectric membranes is presented. The method is based on the frequency dependence of the S-parameters of the structure obtained through electromagnetic simulations. As an application of this method results about microstrip coupled lines are presented
Keywords :
S-parameters; coupled transmission lines; digital simulation; microstrip lines; transmission line theory; S-parameters; characterization; coupled transmission lines; electromagnetic simulations; frequency dependence; microstrip coupled lines; thin dielectric membranes; Biomembranes; Circuit simulation; Design automation; Dielectric substrates; Distributed parameter circuits; Electromagnetic coupling; Frequency; Impedance; Manufacturing; Microstrip;
Conference_Titel :
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-5885-6
DOI :
10.1109/SMICND.2000.890226
