DocumentCode
1739218
Title
Building-in reliability technology for diodes manufacturing
Author
Bazu, M. ; Udrea-Spenea, M. ; Tsoi, E. ; Turtudau, F. ; Ilian, V. ; Papaioannou, G. ; Galateanu, L. ; Stan, A. ; Tserepi, A. ; Bucur, M.
Author_Institution
IMT Bucharest, Romania
Volume
1
fYear
2000
fDate
2000
Firstpage
333
Abstract
A building-in reliability technology was implemented to the manufacturing of Schottky power diodes. The main input variables (process and control parameters) contributing to the reliability were identified, optimised and monitored in the purpose to increase the reliability level
Keywords
Schottky diodes; power semiconductor diodes; semiconductor device reliability; Schottky power diode; built-in reliability technology; device manufacturing; Birds; Condition monitoring; Input variables; Manufacturing; Materials testing; Power system reliability; Process control; Schottky diodes; Semiconductor device testing; Semiconductor diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location
Sinaia
Print_ISBN
0-7803-5885-6
Type
conf
DOI
10.1109/SMICND.2000.890248
Filename
890248
Link To Document