DocumentCode
1739235
Title
VCSELs: prospects and challenges for optical interconnects
Author
Ebeling, K.J.
Author_Institution
Dept. of Optoelectron., Ulm Univ.
Volume
1
fYear
2000
fDate
2000
Firstpage
7
Abstract
Ever increasing clock rates in computers, presently just passing 1 GHz, and ever growing traffic in the internet with data rates above 1 Terabit per second observed in single-fiber backbone strands indicate the stringent speed requirements imposed on current and future data distribution and data processing systems. It is generally agreed upon that such high data rates can be transmitted most favorably by using optical techniques. Moreover, vertical-cavity surface-emitting laser diodes (VCSELs) are considered almost ideal transmitters for short distance optical interconnects such as local area computer networks, rack-to-rack or board-to-board interconnects, or eventually maybe even inter-chip data links. Low cost mass fabrication with ready on-wafer testing are obvious advantages of VCSEL sources compared to conventional edge emitting laser diodes. It is the purpose of the present contribution to review VCSEL based optical interconnects and point out future demands
Keywords
Internet; computer networks; optical fibre networks; optical interconnections; semiconductor device testing; semiconductor laser arrays; surface emitting lasers; telecommunication traffic; VCSEL based optical interconnects; VCSELs; board-to-board interconnects; clock rates; computer networks; data distribution; data processing systems; edge emitting laser diodes; inter-chip data links; internet traffic data rates; on-wafer testing; optical interconnects; single-fiber backbone; vertical-cavity surface-emitting laser diodes; Clocks; Computer networks; Data processing; Diode lasers; Distributed computing; Internet; Optical interconnections; Optical transmitters; Spine; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location
Rio Grande
ISSN
1092-8081
Print_ISBN
0-7803-5947-X
Type
conf
DOI
10.1109/LEOS.2000.890646
Filename
890646
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