Title :
Correlation between the failure mechanism and dark currents of high power photodetectors
Author :
Islam, M.S. ; Nespola, A. ; Yeahia, M. ; Wu, M.C. ; Sivco, D.L. ; Cho, A.Y.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
We experimentally investigate the role of dark current on the failure mechanism of high power photodiodes. A theoretical model built to fit the experimental data indicates that the effective barrier height and the dark current are the fundamental parameters in the failure mechanism
Keywords :
dark conductivity; photodetectors; photodiodes; reliability; dark currents; effective barrier height; failure mechanism; fundamental parameters; high power photodetectors; theoretical model; Dark current; Failure analysis; P-i-n diodes; Photoconductivity; Photodetectors; Photodiodes; Power dissipation; Schottky diodes; Temperature; Testing;
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
Print_ISBN :
0-7803-5947-X
DOI :
10.1109/LEOS.2000.890684
