Third-order optical nonlinearities of Ge nanocrystals embedded in a silica matrix

Author

Li, H.P. ; Kam, C.H. ; Lam, Y.L. ; Jie, Y.X. ; Wee, A.T.S. ; Hua, C.H.A. ; Ji, W.

Author_Institution

Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore

Volume

1

fYear

2000

fDate

2000

Firstpage

314

Abstract

We report an experimental investigation of third-order optical nonlinearities of Ge nanocrystals (NC)´s embedded in silica matrix using femtosecond laser pulses at 780-nm wavelength. Both the nonlinear absorption and nonlinear refraction index of the Ge NC´s have been measured using the Z-scan method and the dynamics of the absorptive nonlinearity has been investigated with the pump-probe technique. The mechanisms responsible for the observed nonlinear response are also discussed

Keywords

elemental semiconductors; germanium; high-speed optical techniques; light absorption; nanostructured materials; nonlinear optics; optical pumping; refractive index; 780 nm; Ge; Ge nanocrystals; Z-scan method; absorptive nonlinearity; femtosecond laser pulses; nonlinear absorption; nonlinear refraction index; nonlinear response; pump-probe technique; silica matrix; third-order optical nonlinearities; Absorption; Nanocrystals; Nonlinear optics; Optical pulses; Optical pumping; Optical refraction; Pump lasers; Silicon compounds; Ultrafast optics; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE

Conference_Location

Rio Grande

ISSN

1092-8081

Print_ISBN

0-7803-5947-X

Type

conf

DOI

10.1109/LEOS.2000.890804

Filename

890804