DocumentCode
1739941
Title
Near-field microscopy of photonic devices
Author
Goldberg, Bennett B.
Author_Institution
Dept. of Phys., Boston Univ., MA, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
426
Abstract
Near-field scanning optical microscopy has been used to measure internal optical modes in photonic devices. By combining the standing mode period, transverse mode shape and decay constants, the values of all spatial components of the wavevector are determined
Keywords
integrated optics; near-field scanning optical microscopy; optical testing; optical waveguides; decay constants; guided wave optical device testing; internal optical modes; near-field microscopy; near-field scanning optical microscopy; photonic devices; spatial components; standing mode period; transverse mode shape; wavevector; Integrated optics; Large Hadron Collider; Optical coupling; Optical devices; Optical fiber networks; Optical microscopy; Optical scattering; Optical waveguides; Shape; Silicon compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location
Rio Grande
ISSN
1092-8081
Print_ISBN
0-7803-5947-X
Type
conf
DOI
10.1109/LEOS.2000.893896
Filename
893896
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