Title :
High resolution subsurface microscopy technique
Author :
Ippolito, Stephen Bradley ; Swan, Anna K. ; Goldberg, Bennett U. ; Ünlü, M. Selim
Author_Institution :
Dept. of Phys. & Electr. & Comput. Eng., Boston Univ. Photonics Center, MA, USA
Abstract :
The numerical aperture increasing lens (NAIL) technique increases the NA and subsequent resolution while preserving stigmatic imaging, and is therefore a significant improvement over standard optical microscopy for subsurface imaging at the diffraction limit. We give experimental data which demonstrates the NAIL technique capability
Keywords :
aberrations; image resolution; lenses; light diffraction; optical microscopy; NA; NAIL technique; diffraction limit; high resolution subsurface microscopy technique; numerical aperture increasing lens technique; optical microscopy; resolution; stigmatic imaging; subsurface imaging; Apertures; Lenses; Nails; Optical diffraction; Optical imaging; Optical materials; Optical microscopy; Optical refraction; Optical variables control; Spatial resolution;
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
Print_ISBN :
0-7803-5947-X
DOI :
10.1109/LEOS.2000.893898
