DocumentCode
1739978
Title
Characterization of attachment techniques for single mode devices
Author
Green, Evan D H
Author_Institution
New Focus Inc., Santa Clara, CA, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
796
Abstract
For single mode devices intended for deployment in telecommunications applications, not only does the initial placement accuracy need to meet the tolerance described above, but the tolerance is required to be as tight over a wide range of environmental conditions, and for a long lifetime. In order to use the extremely sensitive position measurement capabilities afforded by interferometry, we also developed a test method using high-finesse Fabry-Perot interferometers. By monitoring shifts in the transmitting wavelength of the interferometer, highly accurate length changes can be measured
Keywords
Fabry-Perot interferometers; light interferometry; measurement errors; optical communication equipment; optical fibre losses; optical testing; sensitivity; attachment techniques; environmental conditions; extremely sensitive position measurement capabilities; high-finesse Fabry-Perot interferometers; highly accurate length changes; initial placement accuracy; long lifetime; monitoring shifts; single mode devices; telecommunications applications; transmitting wavelength; Chemical analysis; Collimators; Laser beams; Lenses; Metrology; Monitoring; Optical fiber devices; Optical fiber polarization; Telecommunications; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location
Rio Grande
ISSN
1092-8081
Print_ISBN
0-7803-5947-X
Type
conf
DOI
10.1109/LEOS.2000.894094
Filename
894094
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