• DocumentCode
    1739978
  • Title

    Characterization of attachment techniques for single mode devices

  • Author

    Green, Evan D H

  • Author_Institution
    New Focus Inc., Santa Clara, CA, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    796
  • Abstract
    For single mode devices intended for deployment in telecommunications applications, not only does the initial placement accuracy need to meet the tolerance described above, but the tolerance is required to be as tight over a wide range of environmental conditions, and for a long lifetime. In order to use the extremely sensitive position measurement capabilities afforded by interferometry, we also developed a test method using high-finesse Fabry-Perot interferometers. By monitoring shifts in the transmitting wavelength of the interferometer, highly accurate length changes can be measured
  • Keywords
    Fabry-Perot interferometers; light interferometry; measurement errors; optical communication equipment; optical fibre losses; optical testing; sensitivity; attachment techniques; environmental conditions; extremely sensitive position measurement capabilities; high-finesse Fabry-Perot interferometers; highly accurate length changes; initial placement accuracy; long lifetime; monitoring shifts; single mode devices; telecommunications applications; transmitting wavelength; Chemical analysis; Collimators; Laser beams; Lenses; Metrology; Monitoring; Optical fiber devices; Optical fiber polarization; Telecommunications; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
  • Conference_Location
    Rio Grande
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-5947-X
  • Type

    conf

  • DOI
    10.1109/LEOS.2000.894094
  • Filename
    894094