Title :
An empirical study on the effects of test type ordering on overall test efficiency
Author :
Butler, Kenneth M. ; Saxena, Jayashree
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
The order in which the various test types are applied can have an impact on the overall efficiency of the test operation. Furthermore, the speed at which the tests can be executed and the latency of defect detection are also important factors. In this paper, we evaluate an exhaustive set of test orderings over a variety of assumed execution parameters to analyze their effects on overall tester time consumption
Keywords :
automatic testing; integrated circuit testing; production testing; SEMATECH test methods; defect detection latency; execution parameters; overall tester time consumption; test application order; test efficiency; test execution speed; test type ordering; tester program efficiency; Anatomy; Circuit testing; Delay effects; Failure analysis; Instruments; Integrated circuit testing; Logic devices; Logic testing; Manufacturing; Silicon;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894232
